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Wafer Yield Analysis
The water yield analysis application is used by leading micro-chip manufacturers throughout the world to improve the profitability of their fabrication facilities. The application is comprised of a wafer scanning device that collects defect information, a server to manage information collected from the entire facility, and wafer yield analysis software.
PSA has had significant involvement in the development of the GUI of wafer yield analysis software. The wafer yield analysis software is a Windows based application that includes features such as charting, 2D and 3D graphics, data tables, and printing. PSA has implemented the functionality for the 2D and 3D graphics, data tables and printing capabilities. The project included the implementation of many features improving analysis and user friendliness within the GUI. The application provides new enhancements to handle charting, 2D&3D Graphics, Data Tables and Printing. PSA ported the existing software from Microsoft Windows 3.1 to HP UX 9.05 and 10. PSA also provided maintenance and custom enhancement requests for the software versions from 3.5 to 5.2.